ATOMIC FORCE MICROSCOPE
Atomic Force Microscope (AFM) is often called the Eye of Nanotechnology. AFM, also referred to as SPM or Scanning Probe Microscopy, is a high-resolution imaging technique that can resolve features as small as an atomic lattice in the real space. It allows researchers to observe and manipulate molecular and atomic level features. AFM works by bringing a cantilever tip in contact with the surface to be imaged. An ionic repulsive force from the surface applied to the tip bends the cantilever upwards. The amount of bending, measured by a laser spot reflected onto a split photo detector, can be used to calculate the force. By keeping the force constant while scanning the tip across the surface, the vertical movement of the tip follows the surface profile and is recorded as the surface topography by the AFM.
The AAPPI version of AFM is a Molecular Imaging PicoPlus (currently Agilent 5500) system using a PicoSPMII Microscope, a PicoScan 2500 controller, a video microscope working as the micropositioner, and a Multi-purpose scanner working under acoustic AC mode. This AFM can perform close-loop scans and surface manipulation. The hot stage (up to 250 °C) and the environmental chamber offer the capability of observation of changes of nanostructures at elevated temperatures and controlled environments.
Phase Image Amplitude Image
Height Image 3-D image
